Microscopic Simulation of Xenon-Based Optical TPCs in the Presence of Molecular Additives
C. D. R. Azevedo,D. Gonzalez-Diaz,S. F. Biagi,C. A. B. Oliveira,C. A. O. Henriques,J. Escada,F. Monrabal,J. J. Gomez-Cadenas,V. Alvarez,J. M. Benlloch-Rodriguez,F. I. G. M. Borges,A. Botas,S. Carcel,J. V. Carrion,S. Cebrian,C. A. N. Conde,J. Diaz,M. Diesburg,R. Esteve,R. Felkai,L. M. P. Fernandes,P. Ferrario,A. L. Ferreira,E. D. C. Freitas,A. Goldschmidt,R. M. Gutierrez,J. Hauptman,A. I. Hernandez,J. A. Hernando Morata,V. Herrero,B. J. P. Jones,L. Labarga,A. Laing,P. Lebrun,I. Liubarsky,N. Lopez-March,M. Losada,J. Martin-Albo,G. Martinez-Lema,A. Martinez,A. D. McDonald,C. M. B. Monteiro,F. J. Mora,L. M. Moutinho,J. Munoz Vidal,M. Musti,M. Nebot-Guinot,P. Novella,D. Nygren,B. Palmeiro,A. Para,J. Perez,M. Querol,J. Renner,L. Ripoll,J. Rodriguez,L. Rogers,F. P. Santos,J. M. F. dos Santos,L. Serra,D. Shuman,A. Simon,C. Sofka,M. Sorel,T. Stiegler,J. F. Toledo,J. Torrent,Z. Tsamalaidze,J. F. C. A. Veloso,R. Webb,J. T. White,N. Yahlali Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment（2017）
Key words
Optical TPCs,Microscopic simulation,Xenon scintillation
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