CMOS-sensors for Energy-Resolved X-ray ImagingD. Doering,S. Amar-Youcef,J. Baudot,M. Deveaux,W. Dulinski,M. Kachel,B. Linnik,C. Muentz,Joachim StrothJournal of Instrumentation（2016）引用 14|浏览339关键词Inspection with x-rays,X-ray fluorescence (XRF) systems,X-ray detectorsAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
