EBIT Observation of Ar Dielectronic Recombination Lines Near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters
ASTROPHYSICAL JOURNAL（2019）
关键词
atomic processes,line: identification,methods: laboratory: atomic,techniques: spectroscopic,X-rays: galaxies: clusters
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要