A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI
IEEE journal of solid-state circuits（2019）
Key words
Aging,bias temperature instability (BTI),CMOS,degradation,hot carrier injection (HCI),negative BTI (NBTI),positive BTI (PBTI),random telegraph noise (RTN),reliability,statistical characterization,variability
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