Compact Modeling and Simulation of Accelerated Circuit Aging
2018 IEEE Custom Integrated Circuits Conference (CICC)（2018）
Key words
accelerated circuit aging,circuit operation,aging effects,iterative simulations,elevated degradation rate,circuit topology,circuit simulation,benchmark circuits,reliability physics,silicon data,size 65.0 nm,size 28.0 nm,size 14.0 nm,size 16 nm,Si
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