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Feasibility of Simultaneous Surface Topography and XRF Mapping Using Shear Force Microscopy

M. Dehlinger, C. Dorczynski,C. Fauquet,F. Jandard,D. Tonneau,A. Bjeoumikhov,S. Bjeoumikhova,R. Gubzhokov,A. Erko,I. Zizak,D. Pailharey,S. Ferrero,B. Dahmani

International Journal of Nanotechnology（2012）

Cited 7|Views22
Key words
X-ray spectroscopy,characterisation tools,nano-characterisation
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