New Fast Beam Conditions Monitoring (BCM1F) System for CMS

A. A. Zagozdzinska,A. J. Bell,A. E. Dabrowski,M. Hempel,H. M. Henschel,O. Karacheban,D. Przyborowski,J. L. Leonard,M. Penno,K. T. Pozniak,M. Miraglia,W. Lange,W. Lohmann,V. Ryjov, A. Lokhovitskiy,D. Stickland,R. Walsh

Journal of instrumentation（2016）

引用 7|浏览14

关键词

Detector control systems (detector and experiment monitoring and slow-control systems, architecture, hardware, algorithms, databases),Diamond Detectors,Beam-line instrumentation (beam position and profile monitors,beam-intensity monitors,bunch length monitors),Particle identification methods

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