Single event upset in SRAM cells in FPGAs with high resistivity gate structuresMartin L Voogel,A Lesea,Joe J Fabula, C Carmichael,Shahin Toutounchi,Michael J Hart, Steven P Young,Kevin T Look,Jan L De Jongmag（2008）引用 26|浏览4AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
