A Subthreshold Slope and Low-Frequency Noise Characteristics in Charge Trap Flash Memories with Gate-All-Around and Planar Structure
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE（2012）
关键词
Subthreshold slope (SS),charge trap flash (CTF) memory,gate-all-around (GAA),low-frequency noise,interface trap (N-IT)
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要