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Femtosecond X-Ray Diffuse Scattering Measurements of Semiconductor Ablation Dynamics

A. M. Lindenberg,S. Engemann,K. J. Gaffney,K. Sokolowski-Tinten,J. Larsson,D. Reis,P. Lorazo,J. B. Hastings

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE（2008）

Cited 1|Views5
Key words
femtosecond,x-ray diffraction,ablation
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