Observations of Memory Effects and Reduced Breakdown Delay Via Penning Gas Mixtures in High-Power Microwave Dielectric Window Discharges
IEEE Transactions on Plasma Science（2015）
Key words
Dielectric barrier discharge,electronic attack (EA),high-power electromagnetics (EMs),high-power microwave (HPM),HPEM,intentional EM interference,Penning effect,Penning ionization,plasma breakdown,plasma shielding
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