Proton Irradiation of A Swept Charge Device at Cryogenic Temperature and the Subsequent Annealing

J. P. D. Gow,P. H. Smith,P. Pool,D. J. Hall,A. D. Holland,N. J. Murray

JOURNAL OF INSTRUMENTATION（2015）

Cited 17|Views11

Key words

X-ray detectors,Radiation damage to detector materials (solid state),Cryogenic detectors,Photon detectors for UV,visible and IR photons (solid-state) (PIN diodes, APDs, SiPMTs, G-APDs, CCDs, EBCCDs, EMCCDs etc)

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