Review of LDMOS Time Dependent Degradation Based on Low-Frequency Noise Modeling
2013 22nd International Conference on Noise and Fluctuations (ICNF)（2013）
关键词
1/f noise,LDMOS,Unified 1/f Noise Model,Extended drain,Effective oxide trap density
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要