订阅小程序
旧版功能

Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations

2008 IEEE Radiation Effects Data Workshop(2008)

引用 5|浏览0
关键词
field programmable gate arrays,integrated circuit testing,logic testing,nanotechnology,radiation hardening,system-on-chip,Xilinx Virtex V FPGA,dose rate hardening,epi substrates,field programmable gate array,ionizing dose rate experiments,nanoscale technology,systems-on-a-chip
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要