Investigation of substrate injection disturb mechanism in high density flash FPGA devices

Seong Rag Kim,N Chan,B Sharokhi,Habtom Micael, J Yaonan,S Samiee,Kyung Joon Han,B Cronquist

S. Lake Tahoe, CA（2007）

Cited 4|Views2

Key words

field programmable gate arrays,flash memories,flash fpga cell,gate disturb failures,high density flash fpga devices,parasitic bipolar transistor,programming disturb mechanism,substrate injection disturb mechanism,bipolar transistor

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