Single Event Effects Test and Analysis Results from the Boeing Radiation Effects Laboratory (BREL)

JL Wert,E Normand,DL Oberg, DC Underwood, M Vallejo, C Kouba, TE Page, WA Perry

NSREC 2005 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD（2005）

Cited 2|Views19

Key words

proton effects,semiconductor device testing,Boeing Radiation Effects Laboratory,SEFI cross sections,SEL cross sections,SEU cross sections,heavy ion effects,proton effects,single event effects testing

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