Compendium of Single Event Failures in Power MOSFETs
1998 IEEE Radiation Effects Data Workshop NSREC 98 Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat No98TH8385)
Key words
collections of physical data,power MOSFET,proton effects,radiation hardening (electronics),semiconductor device testing,data compendium,failure thresholds,power MOSFETs,single event burnout,single event failures,single event gate rupture,single ion strikes
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