Irradiation Experiments with High-Voltage Power Devices As a Possible Means to Predict Failure Rates Due to Cosmic Rays

P Voss,KH Maier,HW Becker,E Normand,JL Wert, DI Oberg,PP Majewski

Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's

Cited 20|Views8

Key words

alpha-particle effects,cosmic ray interactions,failure analysis,ion beam effects,neutron effects,p-n junctions,power semiconductor diodes,semiconductor device reliability,α-particle irradiation,17 to 252 MeV,800 MeV,98 MeV,active areas,cosmic rays,failure rates,fall-off,high-voltage power devices,ion irradiation,neutron irradiation,pn-junction,power semiconductor diodes

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