Beam Test of a Large Area N-on-n Silicon Strip Detector with Fast Binary Readout Electronics
Nuclear Science Symposium, 1996 Conference Record, 1996 IEEE（1996）
关键词
detector circuits,nuclear electronics,proton detection,semiconductor device noise,silicon radiation detectors,ATLAS SCT detector,Si,edge region,fast binary readout electronics,full depletion voltage,irradiated detector modules,large area n-on-n silicon strip detector,noise occupancy,protons
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