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Conductivity and Distribution of Charge on Electroluminescent Si/SiO2 Structures Investigated by Electrostatic Force Microscopy

T Suominen,P Paturi,H Huhtinen,L Heikkila,HP Hedman,R Punkkinen,R Laiho

Applied Surface Science（2004）

Cited 4|Views9
Key words
electrostatic force microscopy,electroluminescence,silicon/silicon dioxide,conductivity processes
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