Development of A Test Methodology for Single-Event Transients (sets) in Linear Devices

C Poivey,JW Howard,S Buchner,KA LaBel,JD Forney,HS Kim,A Assad

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2001）

引用 25|浏览9

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bipolar analog integrated circuits,comparators,integrated circuits,ion radiation effects,laser radiation effects,linear circuits,operational amplifiers,radiation effects

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