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Influence of Os-Ru Coating on Closed-Space Diode Tests of M-Type Dispenser Cathodes

P. Swartzentruber,T. J. Balk,S. Roberts

2011 IEEE International Vacuum Electronics Conference (IVEC)(2011)

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关键词
Os-Ru film microstructures,standard Semicon film,thick film,thin film microstructures,Os-Ru interdiffusion,knee temperature,life testing,stable knee temperature,M-Type dispenser cathode,different osmium-ruthenium,Os-Ru coating,closed-space diode test
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