Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations

Bishnu Prasad Das,V Janakiraman, Bharadwaj Amrutur,H. S. Jamadagni,N. V. Arvind

21ST INTERNATIONAL CONFERENCE ON VLSI DESIGN HELD JOINTLY WITH THE 7TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS, PROCEEDINGS（2008）

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关键词

global process variation,input edge slew,local process parameter,local process variation,maximum error,slew model,standard cell gate,standard deviation,standard polynomial mod,temperature scal,Intra-Gate Variations,Temperature Scalable Gate Delay

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