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Papers共 45 篇Author StatisticsCo-AuthorSimilar Experts
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D. Edelstein,S. Nguyen, H. Huang, A. Jog, J. Church, S. Ghosh,N. Lanzillo, M. Lofaro, S. McDermott,D. Metzler, C. Meagher,Y. Mignot,T. Nogami, F. Petrescu, M. Shoudy, M. Silvestre, A. Simon, L. Wangoh, H. Zhang
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
Advanced Etch Technology and Process Integration for Nanopatterning XI (2022)
P. Bhosale,N. Lanzillo,K. Motoyama,T. Nogami,A. Simon,H. Huang, K. Chen,Y. Mignot,D. Edelstein,N. Loubet,B. Haran,S. Parikh,R. Tao,M. Gage, S. Reidy, L. Chen,M. Stolfi,J. Lee,F. Chen, T. Ha,A. Yeoh,S. Natarajan
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Advances in Patterning Materials and Processes XXXVII (2020)
Design-Process-Technology Co-optimization for Manufacturability XIV (2020)
Takeshi Nogami,Oleg Gluschenkov,Yasir Sulehria,Son Nguyen,Huai Huang,Nick A. Lanzillo,Anuja DeSilva,Yann Mignot,Jennifer Church,Joe Lee,Prasad Bhosale,Raghuveer Patlolla,Devika Sil,Hosadurga Shobha,James Kelly,Juntao Li,James Demarest,Andrew Simon,Lawrence Clevenger, Brown Peethala Dan Edelstein,Bala Haran
James Hsueh-Chung Chen, Mary-Claire Silvestre, Somnath Ghosh,Yann Mignot,James J. Kelly,Lawrence A. Clevenger,Terry A. Spooner
2020 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE (IITC)pp.25-27, (2020)
Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019 (2019)
NOVEL PATTERNING TECHNOLOGIES FOR SEMICONDUCTORS, MEMS/NEMS, AND MOEMS 2019 (2019)
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Author Statistics
#Papers: 45
#Citation: 1375
H-Index: 14
G-Index: 37
Sociability: 6
Diversity: 2
Activity: 0
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