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Papers共 72 篇Author StatisticsCo-AuthorSimilar Experts

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Impact of External Magnetic Fields on STT-MRAM: an Application Note
Bernard Dieny, Sanjeev Aggarwal,Vinayak Bharat Naik,Sebastien Couet,Thomas Coughlin,Shunsuke Fukami,Kevin Garello, Jack Guedj,Jean Anne C. Incorvia, Laurent Lebrun,Kyung-Jin Lee, Daniele Leonelli,Yonghwan Noh, Siamak Salimy,Steven Soss, Luc Thomas,Weigang Wang,Daniel C. Worledge
IEEE Electron Devices Magazineno. 3 (2024): 52-59
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Embedded STT-MRAM for Automotive Applications
J. Mueller,B. Pfefferling,T. Merbeth,Y. Otani, D. Sanchez Hazen, T. Hula, M. Mansueto, A. Titova, L. Ramasubramanian, C. V-B Grimm,M. Weisheit, G. Wolf, V. Kriegerstein,A. Vogel, P. Scharf, Y. Wang,Y. Huang, V. S. Komma, R. Uma Sankar,H. Yoon,O. Kallensee,V. B. Naik,S. Soss
8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024pp.750-752, (2024)
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Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation
J. Tan,J. H. Lim,J. H. Kwon,V. B. Naik,N. Raghavan,K. L. Pey
IEEE International Reliability Physics Symposiumpp.1-6, (2023)
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From Emergence to Prevalence: 22FDX® Embedded STT-MRAM
Johannes Mueller,Aleksandra Titova,Hongsik Yoon, Thomas Merbeth,Martin Weisheit,Georg Wolf, Sanjeeb Bharali, Bert Pfefferling,Yuichi Otani, Tetyana Shapoval,Alberto Cagliani, Ferenc Vajda, Pedram Sadeghi, Christiana Villas-Boas Grimm, Frank Krause, Ines Altendorf, Gabriele Congedo,Robert Binder,Joachim Metzger, Alexander Lajn, Markus Langner, Young Seon You, Oliver Kallensee,Vinayak B. Naik,Kazutaka Yamane,Steven Soss
2022 IEEE International Memory Workshop (IMW) (2022)
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Author Statistics

#Papers: 72

#Citation: 1374

H-Index: 23

G-Index: 36

Sociability: 5

Diversity: 2

Activity: 4

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