Tomas Vystavel - Materials Science Center and the Netherlands Institute for Metals Research, University of Groningen

基本信息

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职业迁徙

个人简介

Tomas Vystavel currently works at Thermo Fisher Scientific. He is focused on development of new methods in electron microscopy. He contributes to research projects in Materials characterization and Nanotechnology.

研究兴趣

论文共 120 篇作者统计合作学者相似作者

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Electron Channeling Pattern Imaging – a Novel Approach for the Determination of Wafer Offcut Angles

Han,Strakos Libor,Porret Clément,Depauw Valérie,Vystavel Tomas,Richard Olivier, Grieten Eva,Hantschel Thomas

BIO Web of Conferences (2024): 07022

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In-situ Electrical Characterization of MOSFET Transistors Using AFM-in-SEM Solution

Novotny Ondrej,Strakos Libor,Patocka Marek, Schanilec Vojtech,Hegrova Veronika,Celano Umberto,Vystavel Tomas,Neuman Jan

BIO Web of Conferences (2024): 24023

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In-situ Correlative AFM-SEM Characterization for Failure Analysis

Jan Neuman,Radek Dao,Ondřej Novotný, Vojtěch Schánilec,Veronika Hegrová,Libor Strakoš,Tomáš Vystavěl,Umberto Celano

International Symposium for Testing and Failure Analysis ISTFA 2023 Tutorial Presentations from the 49th International Symposium for Testing and Failure Analysis (2023)

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Application and Optimization of Automated ECCI Mapping to the Analysis of Lowly Defective Epitaxial Films on Blanket or Patterned Wafers

Han,Thomas Hantschel,Pieter Lagrain,Clement Porret,Roger Loo,Marina Baryshnikova,Bernardette Kunert,Libor Strakos,Tomas Vystavel

International Symposium for Testing and Failure Analysis ISTFA 2021 Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)

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Tuneable in-situ nanoCT workflow using FIB/SEM