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Papers共 47 篇Author StatisticsCo-AuthorSimilar Experts

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Opposing Mean Error Compensation for Accuracy Enhancement in Analog Compute-in-Memory with Resistive Switching Devices
Wei-Hsing Huang, Woocheol Lee, Joong Sik Kim, Won-Tae Koo,Dong Ik Suh,Seho Lee,Jaeyun Yi,Seon Yong Cha,Shimeng Yu
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 2 (2025): 934-938
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DRAM Technology & Design Optimization for Sub-10nm and Beyond
Minsoo Yoo,Sulhwan Lee, Aeri Son, Shingyu Choi,Choongki Kim,Kyoungchul Jang, Kangsik Choi,Yongtaik Kim, Weonchul Jeon, Seonsoon Kim, Youngman Cho,Choonhwan Kim, Ilsup Jin,Seonyong Cha, Jonghwan Kim
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
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Realistic Noise-aware Training As a Component of the Holistic ACiM Development Platform
Jihun Kim,Sangsu Park, Hongju Suh, Youngjae Kwon, Seonghun Lee, Yubin Lee, Kayoung Kim, Eungu Han, Jongil Kim,Kyu Sung Kim,Hyejung Choi,Seungwook Ryu, Su Jin Chae,Seho Lee,Soo Gil Kim,Jaeyun Yi,Seonyong Cha
2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW (2024)
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First Demonstration of Fully Integrated 16 Nm Half-Pitch Selector Only Memory (SOM) for Emerging CXL Memory
Myoungsub Kim, Yooncheol Bae, Jaehyuk Park, Jeongho Yeon, Hyungjoon Shim, Sehyun Jin, Hyunsoo Kim, Sangchul Oh, Gapsok Do, Dongyeol Yun,Hyung Dong Lee, David Ahn, Junghun Lee, Muhui Park, Junghyuk Yoon, Jeongho Yi,Taekseung Kim, Gain Park,Seoungju Chung,Junho Cheon,Sujin Chae, Namkyun Park, Kyunghoon Kim,Dongyean Oh,Jaeyun Yi,Seonyong Cha
Symposium on VLSI Technologypp.1-2, (2024)
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Reliable Memory Operation with Low Read Disturb Rate in the World Smallest 1Selector-1Mtj Cell for 64 Gb Cross-Point MRAM
Hisanori Aikawa, Jeonghwan Song,Toshihiko Nagase, Soo Man Seo, Yuichi Ito,Tae Jung Ha, Kenichi Yoshino, Bo Kyung Jung, Tadaaki Oikawa,Ku Youl Jung, Su Jin Chae, Bum Su Kim, Min Chul Shin, Dong Keun Kim, Tae Ho Kim,Kosuke Hatsuda,Katsuhiko Hoya,Soo Gil Kim, Jae Yun Yi,Seon Yong Cha
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
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Analog Computation in Ultra-High Density 3D FeNAND for TB-level Hyperscale AI Models
Jae-Gil Lee, Won-Tae Koo, Geonhui Lee, Jihun Kim, Woocheol Lee,Hyung Dong Lee,Sunghyun Yoon, Sung-In Hong,In-Ku Kang,Joongsik Kim,Hyejung Choi,Soo Gil Kim,Seho Lee,Jaeyun Yi,Seon Yong Cha
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
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Author Statistics

#Papers: 47

#Citation: 357

H-Index: 11

G-Index: 17

Sociability: 5

Diversity: 2

Activity: 20

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