基本信息
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Bio
Ramachandran Muralidhar received the Ph.D. degree in chemical engineering from Purdue University in 1988. He has been with IBM since 2008. He has an interdisciplinary modeling background and has contributed in many areas, including inverse problems for colloidal systems and methane leak detection, nonequilibrium statistical physics of condensed phases, and modeling dispersion of accidental releases of HF mixtures. His contributions in semiconductor technology include the development of silicon nanocrystal memory in Freescale Semiconductor, and investigating process and logic and memory device scaling via simulations for 22 nm node and beyond. He has been recently working on AI applications in the semiconductor industry and methane leak detection. He has over 35 issued patents and has co-authored over 40 publications/conference proceedings and book chapters.
Research Interests
Papers共 139 篇Author StatisticsCo-AuthorSimilar Experts
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Hsinyu Tsai,Pritish Narayanan,Shubham Jain,Stefano Ambrogio,Kohji Hosokawa,Masatoshi Ishii,Charles Mackin,Ching-Tzu Chen,Atsuya Okazaki,Akiyo Nomura,Irem Boybat,Ramachandran Muralidhar,Martin M. Frank,Takeo Yasuda,Alexander Friz,Yasuteru Kohda,An Chen,Andrea Fasoli,Malte J. Rasch,Stanislaw Wozniak,Jose Luquin,Vijay Narayanan,Geoffrey W. Burr
2023 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS (2023)
G. W. Burr,H. Tsai, W. Simon,I. Boybat,S. Ambrogio, C.-E. Ho, Z.-W. Liou,M. Rasch,J. Büchel,P. Narayanan,T. Gordon, S. Jain,T. M. Levin,K. Hosokawa,M. Le Gallo, H. Smith,M. Ishii,Y. Kohda,A. Chen,C. Mackin, A. Fasoli, K. ElMaghraoui,R. Muralidhar,A. Okazaki, C. -T. Chen,M. M. Frank, C. Lammie,A. Vasilopoulos,A. M. Friz, J. Luquin,S. Teehan,I. Ahsan,A. Sebastian,V. Narayanan
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 11 (2023): 5972-5976
Martin M. Frank,Ning Li,Malte J. Rasch,Shubham Jain,Ching-Tzu Chen,Ramachandran Muralidhar,Jin-Ping Han,Vijay Narayanan,Timothy M. Philip,Kevin Brew,Andrew Simon,Iqbal Saraf,Nicole Saulnier,Irem Boybat,Stanislaw Wozniak,Abu Sebastian,Pritish Narayanan,Charles Mackin,An Chen,Hsinyu Tsai,Geoffrey W. Burr
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
2023 IEEE INTERNATIONAL CONFERENCE ON EDGE COMPUTING AND COMMUNICATIONS, EDGEpp.233-244, (2023)
Y. Kim,S-C Seo,S. Consiglio,P. Jamison, H. Higuchi,M. Rasch,E. Y. Wu,D. Kong,I Saraf,C. Catano,R. Muralidhar,S. Nguyen, S. DeVries,O. Van der Straten,M. Sankarapandian,R. N. Pujari,A. Gasasira, S. M. Mcdermott,H. Miyazoe, D. Koty, Q. Yang, H. Yan,R. Clark,K. Tapily,S. Engelmann, R. R. Robison,C. Wajda,A. Mosden,T. Tsunomura, R. Soave,N. Saulnier,W. Haensch,G. Leusink, P. Biolsi,V Narayanan,T. Ando
J. Li,Y. Kim,D. Kong,K. Cheng,S. -C. Seo, C. Robinson,N. Saulnier, R. R. Robison, A. J. Varghese,I. Ahsan,R. Muralidhar,T. Ando,V. Narayanan
International Symposium for Testing and Failure Analysis ISTFA 2020 Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
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Author Statistics
#Papers: 139
#Citation: 3292
H-Index: 32
G-Index: 45
Sociability: 6
Diversity: 2
Activity: 2
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