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    • Research Interests
    NoiseCmos Integrated Circ...Cmos Integrated CircuitsSize 65 NmNoise MeasurementField Effect Mmic201220112014
    20122013

    Papers共 3 篇Author StatisticsCo-AuthorSimilar Experts

    By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
    时间
    引用量
    主题
    期刊级别
    合作者
    合作机构
    All2013
    Author Statistics
    00.20.40.60.81#Papers#CitationH-IndexG-IndexSociabilityDiversityActivity

    #Papers: 3

    #Citation: 54

    H-Index: 3

    G-Index: 3

    Sociability: 3

    Diversity: 1

    Activity: 0

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    • 合作者
    • 学生
    • 导师
    Na Yan (闫娜)合作论文数
    School of Microelectronics, Fudan University3
    Jianfei Xu合作论文数
    2
    Cheng Zhang (张成)合作论文数
    1
    Yilei Li合作论文数
    1
    Jie Sun合作论文数
    1
    Jianjun Gao (高建军)合作论文数
    School of Physics and Electronic Science, East China Normal University1
    Hao Min (闵昊)合作论文数
    School of Microelectronics, Fudan University1
    Xi Tan合作论文数
    Microsoft1
    Xiaoyang Zeng (曾晓洋)合作论文数
    School of Microelectronics, Fudan University1
    Chuansheng Dong合作论文数
    1
    Yexin Chen (陈业新)合作论文数
    1
    Kefeng Han合作论文数
    1
    Yongchang Yu合作论文数
    Fudan University1
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