Prasanna Venkatesan Ravindran - School of Electrical and Computer Engineering, Georgia Institute of Technology

基本信息

浏览量：6

职业迁徙

个人简介

暂无内容

研究兴趣

论文共 28 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选

Impact of the Endurance Measurement Methodology on Ferroelectric Field Effect Transistor under the Capacitive Nondestructive Read

Omkar Phadke,Prasanna Venkatesan Ravindran,Halid Mulaosmanovic,Stefan Dünkel, Sven Beyer, Asif Khan,Suman Datta,Shimeng Yu

IEEE Transactions on Electron Devicesno. 99 (2025): 1-7

引用0浏览0EIWOS引用

Optimizing Memory Window for Ferroelectric Nand Applications: an Experimental Study on Dielectric Material Selection and Layer Positioning

Lance Fernandes,Prasanna Venkatesan Ravindran, Jiayi Chen,Mengkun Tian,Dipjyoti Das,Hang Chen,Winston Chern,Kijoon Kim,Jongho Woo,Suhwan Lim,Kwangsoo Kim,Wanki Kim,Daewon Ha,Shimeng Yu,Suman Datta,Asif Khan

IEEE TRANSACTIONS ON ELECTRON DEVICESno. 1 (2025): 234-239

引用0浏览0EIWOS引用

Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors under Bipolar Stress Conditions

Priyankka Gundlapudi Ravikumar,Prasanna Venkatesan Ravindran,Khandker Akif Aabrar,Taeyoung Song,Sharadindu Gopal Kirtania,Dipjyoti Das,Chinsung Park,Nashrah Afroze,Mengkun Tian,Shimeng Yu,Ahmad Ehtesham Islam,Suman Datta,Souvik Mahapatra,Asif Khan

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)

引用0浏览0EIWOS引用

Plasma-Enhanced Atomic Layer Deposition Based Ferroelectric Field-Effect Transistors

Chinsung Park,Prasanna Venkat Ravindran,Dipjyoti Das,Priyankka Gundlapudi Ravikumar,Chengyang Zhang,Nashrah Afroze, Lance Fernandes, Yu Hsin Kuo,Jae Hur,Hang Chen,Mengkun Tian,Winston Chern,Shimeng Yu,Asif Islam Khan

IEEE Journal of the Electron Devices Society（2024）

引用0浏览0EIWOS引用

Ferroelectric Gate Stack Engineering with Tunnel Dielectric Insert for Achieving High MemoryWindow in FEFETs for NAND Applications

Dipjyoti Das, Hyeonwoo Park, Zekai Wang,Chengyang Zhang,Prasanna Venkatesan Rayindran,Chinsung Park,Nashrah Afroze,Po-Kai Hsu,Mengkun Tian,Hang Chen, Winston Chem,Suhwan Lim,Kwangsoo Kim,Kijoon Kim,Wanki Kim,Daewon Ha,Shimeng Yu,Suman Dutta,Asif Khan

8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024pp.708-710, (2024)

引用4浏览0EIWOS引用

Design Framework for Ferroelectric Gate Stack Engineering of Vertical NAND Structures for Efficient TLC and QLC Operation

Dipjyoti Das, Lance Fernandes,Prasanna Venkatesan Ravindran,Taeyoung Song,Chinsung Park,Ashrah Afroze,Mengkun Tian,Hang Chen, Winston Chem,Kijoon Kim,Jongho Woo,Suhwan Lim,Kwangsoo Kim,Wanki Kim,Daewon Ha,Shimeng Yu,Suman Datta,Asif Khan

2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW（2024）

引用2浏览0EIWOS引用

Self-Healing Ferroelectric Capacitors with ∼ 1000x Endurance Improvement at High Temperatures (85–125°C)

Nashrah Afroze,Andrea Padovani, Jihoon Choi,Priyankka Gundlapudi Ravikumar, Yu-Hsin Kuo,Chengyang Zhang,Taeyoung Song,Mengkun Tian, Eknath Sarkar, Manifa Noor,Prasanna Venkatesan Ravindran,Khandker Akif Aabrar,Bilge Yildiz,Souvik Mahapatra,Andrew Kummel,Kyeongjae Cho,Shimeng Yu,Suman Datta,Jun Hee Lee,Luca Larcher,Gaurav Thareja,Asif Khan

2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)

引用0浏览0EIWOS引用

Material Choices for Tunnel Dielectric Layer and Gate Blocking Layer for Ferroelectric NAND Applications

Lance Fernandes,Prasanna Venkatesan Ravindran,Taeyoung Song,Dipjyoti Das,Chinsung Park,Nashrah Afroze,Mengkun Tian,Hang Chen,Winston Chern,Kijoon Kim,Jongho Woo,Suhwan Lim,Kwangsoo Kim,Wanki Kim,Daewon Ha,Shimeng Yu,Suman Datta,Asif Khan

IEEE ELECTRON DEVICE LETTERSno. 10 (2024): 1776-1779

引用3浏览0EIWOS引用

The Origin of Memory Window Closure with Bipolar Stress Cycling in Silicon Ferroelectric Field-Effect-transistors

Matthias Passlack,Nujhat Tasneem,Chinsung Park,Prasanna Venkat Ravindran,Hang Chen,Dipjyoti Das,Shimeng Yu,Edward Chen,Jer-Fu Wang,Chih-Sheng Chang, Yu-Ming Lin,Iuliana Radu,Asif Khan

Journal of Applied Physicsno. 13 (2024)

引用1浏览0引用

BEOL-Compatible Non-Volatile Capacitive Synapse with ALD W-Doped In2O3 Semiconductor Layer

Junmo Lee,Chengyang Zhang, Minji Shon,James Read,Sunbin Deng,Omkar Phadke,Prasanna Venkatesan Ravindran,Mengkun Tian,Yuan-Chun Luo,Tae-Hyeon Kim,Asif Islam Khan,Suman Datta,Shimeng Yu

2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)

引用0浏览0EIWOS引用

加载更多

作者统计

合作学者

合作机构

D-Core

合作者
学生
导师

暂无相似学者，你可以通过学者研究领域进行搜索筛选

数据免责声明

页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn