Po-Hsun Chen - Dept Appl Sci, ROC Naval Acad

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Analysis of the Formation of the Off-State Leakage Current in P-Gan HEMT

Ya-Huan Lee,Po-Hsun Chen, Yu-Hsuan Yeh,Jui-Tse Hsu, Wei-Chieh Hung,Jia-Hong Lin,Hung-Ming Kuo,Han-Yu Chang, Cheng-Hsien Lin, Yu-Jie Tsai, Chang

IEEE TRANSACTIONS ON ELECTRON DEVICESno. 2 (2025): 625-628

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Analysis of Insulator Breakdown Induced by Body-Grounded-Coupling Effect in GaN-Based MIS-HEMT

Cheng-Hsien Lin,Chien-Hung Yeh,Po-Hsun Chen, Chang,Ya-Huan Lee, Yu-Bo Wang,Ting-Tzu Kuo,Hung-Ming Kuo,Jui-Tse Hsu,Jia-Hong Lin, Bo-Yu Chen, Yu-Hsuan Kuo, Yu-Jie Tsai

IEEE TRANSACTIONS ON ELECTRON DEVICES (2025)

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Forming-Free ZnO-Based Resistive Random Access Memory with Supercritical Fluid Hydrogenation Technique

Sheng-Yao Chou,Po-Hsun Chen, Chen, Chang, Yu-Bo Wang,Hong-Yi Tu,Yong-Ci Zhang,Chung-Wei Wu, Yu-Hsuan Yeh,Tsung-Ming Tsai, Yu-Ching Huang, Yi Huang Chen

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE (2024)

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Utilizing Sulfuration of Supercritical Fluid Treatment to Improve Sensitivity and Humidity Resistance of Chip-Type Gas Sensors

Po-Hsun Chen,Chun-Chu Lin, Chen,Li-Chuan Sun,Chung-Wei Wu,Sheng-Yao Chou,Tsung-Ming Tsai, Chang

Sensors and Actuators B Chemical (2024): 135273-135273

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Phase Transformation on HZO Ferroelectric Layer in Ferroelectric Random-Access Memory Induced by X-Ray Irradiation

Chung-Wei Wu,Po-Hsun Chen, Chang,Yung-Fang Tan,Shih-Kai Lin,Yu-Hsuan Yeh,Yong-Ci Zhang,Hsin-Ni Lin,Kai-Chun Chang,Chien-Hung Yeh,Simon Sze

SEMICONDUCTOR SCIENCE AND TECHNOLOGYno. 2 (2024)

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Cell Size Effects and Distinct Current Conduction Behaviors for Hafnium‐Oxide‐Based Selectors with Vanadium As Top Electrode

Po-Hsun Chen,Chih-Yang Lin,Tsung-Han Yeh,Cheng-Yun Shou

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCEno. 4 (2024)

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An Approach to Extract the Trap States Via the Dynamic $\textit{r}_{\text{on}}$ Method with Substrate Voltage Applied During the Recovery Time

Ya-Huan Lee,Po-Hsun Chen,Yong-Ci Zhang,Chung-Wei Wu,Sheng-Yao Chou,Yu-Bo Wang,Hung-Ming Kuo,Yu-Shan Lin, Yan-Ta Chen, Yu-Jie Tsai, Chang

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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Investigating the Effects of Sulfur Treatment on Material Characteristics and Resistance Switching Device Applications with Supercritical Fluid Technique

Jen-Wei Huang,Po-Hsun Chen,Tsung-Han Yeh,Chih-Cheng Yang

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE（2023）

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Investigating DC and AC Degradation Behaviors to P-type Low Temperature Polycrystalline Silicon Thin Film Transistor with Fin-Like Structure

Po-Hsun Chen,Yu-Zhe Zheng,Tsung-Han Yeh, Tzu-Yun Nieh

JOURNAL OF PHYSICS D-APPLIED PHYSICSno. 43 (2023)

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Analysis of the Extraction Method and Mechanism of Hot Carrier Degradation in Al2O3/Si3N4 Bilayer Gate Dielectric AlGaN/GaN MIS-HEMTs

Jen-Wei Huang,Po-Hsun Chen,Tsung-Han Yeh,Xin-Ying Tsai,Pei-Yu Wu

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITYno. 4 (2023): 510-515

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