基本信息
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Bio
Patrick Villard received his engineer degree from the Ecole Supérieure d'Electricité (Gif-sur-Yvette, near Paris) in 1992 and the Ph.D. from the Université Paris XI (Orsay) in 1995, for his work on the impact of ionizing radiations on CMOS devices.
He then joined the IC design department of the CEA-LETI Laboratory where he worked as ASIC designer in several fields such as gamma-ray and X-ray imaging, remote-power RFID tags, Silicon-On-Insulator devices, etc. From 2004 to 2007 he was leader of the IC Design for Imaging Group, focusing his work on new image sensor architectures. He is now research engineer in the “Wireless Circuits and Architectures” group where he participates to the heterogeneous design of new wireless systems including non-CMOS devices.
Research Interests
Papers共 60 篇Author StatisticsCo-AuthorSimilar Experts
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2022 IEEE Sensors (2022)
Maxime Hermouet,Marc Sansa,Martial Defoort,Louise Banniard, Sergio Dominauez-Medina,Shawn Fostner,Ujwol Palanchoke,Alexandre Fafin,Marc Gely,Louis Hutin,Christophe Plantier,Emmanuel Rolland,Claude Tabone,Giulia Usai,Thomas Ernst,Patrick Villard,Gerard Billiot,Paul Mattei,Guillaume Nonglaton,Caroline Fontelaye, Charlie Barrois,Olivier Castany,Eduardo Gil Santos,Pierre E. Allain,Emeline Vernhes,Pascale Boulanger,Ariel Brenac,Christophe Masselon,Ivan Favero,Thomas Alava,Guillaume Jourdan,Sebastien Hentz
2017 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC)pp.266-266, (2017)
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IEEE Conference Proceedings (2017): 267
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IEEE Conference Proceedings (2016): 3
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Author Statistics
#Papers: 60
#Citation: 737
H-Index: 18
G-Index: 25
Sociability: 5
Diversity: 2
Activity: 0
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