Patrice Gergaud

Patrice Gergaud is a CEA International Expert in X-ray characterization in micro and nanotechnologies, with more than 25 years of experience in this field. After ten years as a Senior Researcher with the French National Center for Scientific Research, in 2006, he joined the nano-characterization platform of the CEA-Minatec Campus, Grenoble and is the Group Leader of the X-Ray Lab. His work is aimed at a better understanding of stresses in microelectronic devices. He has considerable experience in X-ray diffraction and synchrotron radiation. He has authored or coauthored more than 170 articles. His main field of interest is the structure and the mechanical properties of thin films and multilayers.