Michael Dudley

Michael Dudley received the Ph.D. degree in engineering from Warwick University, Coventry, U.K., in 1982. He is a Professor and Chair of the Materials Science and Engineering Department, Stony Brook University, Stony Brook, NY, USA. He is the Director of the Stony Brook Synchrotron Topography Facility at the National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY, USA. His current research focuses on crystal growth and characterization of defect structures in single crystals with a view to determining their origins. The primary characterization technique used is synchrotron topography which enables analysis of defects and generalized strain fields in single crystals in general, with particular emphasis on semiconductor, optoelectronic, and optical crystals. Establishing the relationship between crystal growth conditions and resulting defect distributions is a particular thrust area of interest to him, as is the correlation between electronic/optoelectronic device performance and defect distribution. His group has played a prominent role in the development of SiC and AlN growth, characterizing crystals grown by many of the academic and commercial entities involved enabling optimization of crystal quality. He has coauthored some 340 refereed articles and 12 book chapters and edited five books. Dr. Dudley was on the editorial board of Applied Physics Letters and Journal of Applied Physics from 2008 to 2011. He has also chaired or cochaired several international conferences and has been on the organizational committees for conferences such as the International Conference on Silicon Carbide and Related Materials (ICSCRM), the European Conference on Silicon Carbide and Related Materials (ECSCRM), and the Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP).