I-Yu Huang - Department of Electrical Engineering, National Sun Yat-sen University

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论文共 92 篇作者统计合作学者相似作者

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Highly Sensitive and Highly Specific Biomedical Sensing Device Development for Lung Cancer Tumor Marker

Chia-Hsu Hsieh, Cheng-Chuan Chou, Guan-Hong Chen,I-Yu Huang

IEEE SENSORSpp.1-4, (2024)

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Investigating the Effect of O2 Plasma Treatment on the Operational Characteristics of Schottky-Gate AlGaN/GaN HEMT

An-Chen Liu, Yu-Wen Huang,Hsin-Chu Chen, Yi-Jun Dong,Po-Tsung Tu,Lung-Hsing Hsu,Yung-Yu Lai,Po-Chun Yeh,I-Yu Huang,Hao-Chung Kuo

SEMICONDUCTOR SCIENCE AND TECHNOLOGYno. 8 (2024)

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The Transition of Threshold Voltage Shift of Al2O3 /sin4 AlGaN/GaN MIS-HEMTs under Negative Gate Bias Stress from DC to AC

Ya-Huan Lee,Kai-Chun Chang,Mao-Chou Tai,Yu-Xuan Wang,Hsin-Ni Lin,Yu-Hsuan Yeh,Hung-Ming Kuo,Xin-Ying Tsai,Jason Lee,I-Yu Huang, Chang,Simon Sze

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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Analysis of Abnormal C–V Hump on Si3N4 MIS-HEMT with Mesa Isolation under Negative Gate Bias Stress

Ya-Huan Lee,Kai-Chun Chang,Hsin-Ni Lin,Mao-Chou Tai,Wei-Chen Huang,Jia-Hong Lin,Hung-Ming Kuo,Jason Lee,I-Yu Huang, Chang

IEEE Transactions on Electron Devices（2024）

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Investigating the Arc-Shaped Kink Drain Voltage of Drain Current with Capacitance-Voltage Measurement Method in GaN HEMTs

Jui-Tse Hsu,Shawn S. H. Hsu, Chang,Chen-Hsin Lien,Ting-Tzu Kuo,Chien-Hung Yeh,Jia-Hong Lin,Ya-Huan Lee, Cheng-Hsien Lin,Wei-Chieh Hung,I-Yu Huang

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY（2024）

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The Transition of Threshold Voltage Shift of Al2O3/Si3N4 AlGaN/GaN MIS-HEMTs under Negative Gate Bias Stress from DC to AC

Ya-Huan Lee,Kai-Chun Chang,Mao-Chou Tai,Yu-Xuan Wang,Hsin-Ni Lin,Yu-Hsuan Yeh,Hung-Ming Kuo,Xin-Ying Tsai,Jason Lee,I-Yu Huang, Chang,Simon Sze

IEEE Transactions on Electron Devicesno. 3 (2024): 1792-1797

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The Characteristics and Reliability with Channel Length Dependent on the Deposited Sequence of SiO2 and Si3N4 As PV in LTPS TFTs

Chuan-Wei Kuo,Tsung-Ming Tsai, Chang,Hong-Yi Tu, Yu-Hsiang Tsai,Jian-Jie Chen,I-Yu Huang

IEEE Transactions on Device and Materials Reliability（2024）

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The Transition of Threshold Voltage Shift of Al

Ya-Huan Lee,Kai-Chun Chang,Mao-Chou Tai,Yu-Xuan Wang,Hsin-Ni Lin,Yu-Hsuan Yeh,Hung-Ming Kuo,Xin-Ying Tsai,Jason Lee,I-Yu Huang,Ting-Chang Chang,Simon Sze

IEEE Transactions on Electron Devicesno. 99 (2024): 1-6

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Study of 1500V AlGaN/GaN High-Electron-Mobility Transistors Grown on Engineered Substrates

An-Chen Liu, Pei-Tien Chen, Chia-Hao Chuang, Yan-Chieh Chen, Yan-Lin Chen,Hsin-Chu Chen,Shu-Tong Chang,I-Yu Huang,Hao-Chung Kuo

ELECTRONICSno. 11 (2024)

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Development of an EGFET Microsensor with 3D Structure for High-Specificity Cardiac Troponin I Detection

Chia-Hsu Hsieh, Chih-Hsien Huang, Jia-Huei Lin,Ling-Shan Yu,I-Yu Huang

JOURNAL OF MICROMECHANICS AND MICROENGINEERINGno. 4 (2023)

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