Dr. Fullerton's expertise is in thin-film magnetic and nano-materials. He is an internationally acclaimed scholar in areas such as thin film and superlattice growth, magnetic recording and nano-technologies, and x-ray and neutron scattering. At IBM/Hitachi, Dr. Fullerton made fundamental advances in the development of high density magnetic recording media based on anti-ferromagnetically coupled ferromagnetic films. Early in his career, he developed a technique for mapping the structure of thin-film multi-layers from x-ray diffraction data that became the standard in the field.