基本信息
views: 20

Bio
Byoung-Joo Yoo (Member, IEEE) received the B.S. degree in electrical engineering from Korea University, Seoul, South Korea, in 2005, and the M.S. and Ph.D. degrees in electrical engineering from Seoul National University, Seoul, in 2007 and 2013, respectively.
He is currently a Principle Engineer with Samsung Electronics, Hwaseong, South Korea. His current research focuses on the high-speed serializer–deserializer (SerDes) architecture for next-generation wireline links. His expertise mainly includes digital and analog integrated circuit design for die-to-die interfaces and giga-bit Ethernet protocols.
Research Interests
Papers共 17 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Kihwan Seong,Wooseuk Oh, Hyunwoo Lee,Gyeom-Je Bae,Youngseob Suh,Hyemun Lee, Juyoung Kim,Eunsu Kim, Yeongeon Kang, Gunhu Mo, Youjin Lee, Mingyeong Kim, Seongno Lee, Donguk Park,Byoung-Joo Yoo,Hyo-Gyuem Rhew,Jongshin Shin
openalex(2023)
ISSCCpp.114-115, (2023)
Timothy O. Dickson,Zeynep Toprak Deniz,Martin Cochet,Troy J. Beukema,Marcel Kossel,Thomas Morf,Young-Ho Choi,Pier Andrea Francese,Matthias Brandli,Christian W. Baks,Jonathan E. Proesel,John F. Bulzacchelli,Michael P. Beakes,Byoung-Joo Yoo,Hyoungbae Ahn,Dong-Hyuk Lim,Gunil N. Kang,Sang-Hune Park,Mounir Meghelli,Hyo Gyuem Rhew,Daniel J. Friedman,Michael Choi,Mehmet Soyuer,Jongshin Shin
Serdar S. Yonar,Pier Andrea Francese,Matthias Brändli,Marcel A. Kossel,Thomas Morf,Jonathan E. Proesel,Sergey V. Rylov,Herschel A. Ainspan,Martin Cochet,Zeynep Toprak Deniz,Timothy O. Dickson,Troy J. Beukema,Christian W. Baks,Michael P. Beakes,John F. Bulzacchelli,Young-Ho Choi,Byoung-Joo Yoo,Hyoungbae Ahn,Dong-Hyuk Lim,Gunil Kang,Sang-Hune Park,Mounir Meghelli,Hyo-Gyuem Rhew,Daniel J. Friedman,Michael Choi,Mehmet Soyuer,Jongshin Shin
Cited13Views0Bibtex
13
0
Load More
Author Statistics
#Papers: 17
#Citation: 215
H-Index: 8
G-Index: 14
Sociability: 4
Diversity: 2
Activity: 3
Co-Author
Co-Institution
D-Core
- 合作者
- 学生
- 导师
Data Disclaimer
The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn