I have experience in micro and nanofabrication techniques as well as in the preparation, and characterization of nanostructured carbon materials (nanotubes, graphene, ultrafine graphite etc) e metallic films and devices based on them (thin and ultrathin films, photovoltaic elements, strain and electrochemical sensors); in the following instrumentation techniques: Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, X-ray diffraction (XRD), photoelectron spectroscopy X-ray excitation (XPS), energy dispersion X-ray spectroscopy (EDS), transport (magnetoresistance, Hall effect etc) at cryogenic temperatures. I am also experienced in the analysis of statistical models of the physical processes observed experimentally, including data analysis skills from Raman, XRD and XPS spectroscopy, with emphasis on the identification of spectroscopic signals. In addition, I have skills and basic knowledge in the area of SiP (system in package) device development, specifically in device failure analysis using SEM/EDS techniques and X-ray tomography.